Bipolar electric-field enhanced trapping and detrapping of mobile donors in BiFeO3 memristors
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
Pulsed laser deposited Au-BFO-Pt/Ti/Sapphire MIM structures offer excellent bipolar resistive switching performance, including electroforming free, long retention time at 358 K, and highly stable endurance. Here we develop a model on modifiable Schottky barrier heights and elucidate the physical origin underlying resistive switching in BiFeO3 memristors containing mobile oxygen vacancies. Increased switching speed is possible by applying a large amplitude writing pulse as the resistive switching is tunable by both the amplitude and length of the writing pulse. The local resistive switching has been investigated by conductive atomic force microscopy and exhibits the capability of down-scaling the resistive switching cell to the grain size. (Graph Presented).
Details
Original language | English |
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Pages (from-to) | 19758-19765 |
Number of pages | 8 |
Journal | ACS Applied Materials and Interfaces |
Volume | 6 |
Issue number | 22 |
Publication status | Published - 26 Nov 2014 |
Peer-reviewed | Yes |
External IDs
ORCID | /0000-0003-3814-0378/work/142256296 |
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Keywords
ASJC Scopus subject areas
Keywords
- BiFeO thin films, Bipolar resistive switching, Mobile oxygen vacancy, Modifiable rectification properties, Reliability, Ti diffusion